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Coperta cărții "Advanced Metrology" de autor necunoscut

Advanced Metrology

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Description

Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology.

The inclusion of industrial case studies and examples will help readers to implement these techniques which are being developed across different industries as they offer improvements to the functional performance of products and reduce weight and cost.

Details
  • ISBN: 9780128173237
  • Authors: X. Jane Jiang, Paul J. Scott
  • Language: Rom?n?
  • Publication Year: 2020
  • Format: Paperback
  • Publisher: Elsevier Science
  • Pages: 320
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