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Coperta cărții "Cryo-electron Tomography" de autor necunoscut

Cryo-electron Tomography

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Description

Cryo-Electron Tomography: A Journey from Sample Preparation to Data Mining providing a holistic overview of this rapidly advancing field and equipping researchers with the knowledge and tools necessary to initiate their own investigations.

The book begins with a section on advanced cryogenic sample preparation for in situ cellular tomography, covering a range of sample types including viruses, bacteria, eukaryotic cells, and perspectives for organoids and tissues.

Specific chapters focus on essential approaches such as vitrification, sample thinning, and bimodal correlative techniques.

The book then transitions to a section on data mining and validation.

Details
  • ISBN: 9780443188299
  • Authors: Dorit Hanein, Niels Volkmann
  • Language: Rom?n?
  • Publication Year: 2025
  • Format: Paperback
  • Publisher: Elsevier Science
  • Pages: 282
  • Weight: 470gr
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