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Coperta cărții "VLSI Test Principles and Architectures" de autor necunoscut

VLSI Test Principles and Architectures

294.45 LEI
327.17 LEI
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Description

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Details
  • ISBN: 9780123705976
  • Authors: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
  • Language: Rom?n?
  • Publication Year: 2006
  • Format: Hardcover
  • Publisher: Elsevier Science
  • Pages: 808
  • Weight: 1770gr
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